Milli-Kelvin Scanning Probe Microscope
Subject: Milli-Kelvin Scanning Probe MicroscopeSolicitation Number: BSA473768Notice Type: PRESOLNAICS: 334516Set-Aside: No Set aside usedNotice Published: 03-17-26Response Due: 04-02-26Agency: Department of EnergyOffice: ENERGY, DEPARTMENT OFContact: Mark Brock This email address is being protected from spambots. You need JavaScript enabled to view it. Ph: (631) 344-2713Office Address: Upton, NY 11973Place of Performance: Upton, NY 11973Related Notices:
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BSA is procuring a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV).